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首頁技術支持 測量時鐘振蕩器Cardinal頻率穩定性

測量時鐘振蕩器Cardinal頻率穩定性

來源：http://www.bsgccc.com 作者：康比電子 2023年09月06
Cardinal Clock Oscillator Stability
Cardinal時鐘振蕩器穩定性

Measuring Clock Oscillator Frequency Stability
測量時鐘振蕩器頻率穩定性

Oscillators exhibit a number of frequency/period instabilities. Manufacturers generally specify their oscillators in terms of short term, long term, and environmental frequency stability.
振蕩器表現出許多 頻率/周期不穩定性。 制造商通常會指定他們的石英晶體振蕩器在短期內長期、長期和環境頻率穩定性

Environmental stability reflects the effects of temperature, vibration, power supply variations, and other environmental factors on an oscillator’s output frequency or phase. Figure 1 is an example of the stability of a clock oscillator during warmup from a cold start. The actually oscillator output is shown in Trace 2. The lower trace (trace B) is the trend of mean internal temperature (1mV = 1° C). It shows that during startup the internal temperature increases by about 8° C over a period of 2000 seconds. During that time the average change in the oscillators period is about ±25 ps. This is read in trace C which contains the smoothed measurement of the trend of time interval error at level (tie@lv) . Time interval error at level measures the time difference of an oscillator’s measured period from an ideal period. Trace A, the trend of tie @lv, is overlaid on the smoothed trace. It shows a peak to peak variation of slightly more than ±100 ps. Temperature variation has little effect on this oscillator.
環境穩定性反映了溫度、振動、電源變化和其他環境因素對振蕩器輸出頻率或相位的影響。圖1是時鐘振蕩器在冷啟動預熱期間的穩定性示例。實際振蕩器輸出如圖2所示。較低的軌跡（軌跡B）是平均內部溫度（1mV=1°C）的趨勢。它表明，在啟動過程中，內部溫度在2000秒內增加了約8°C。在這段時間內，石英晶體振蕩器周期的平均變化約為±25 ps。這在軌跡C中讀取，軌跡C包含對水平上時間間隔誤差趨勢的平滑測量(tie@lv)。電平上的時間間隔誤差測量振蕩器的測量周期與理想周期的時間差。軌跡A（tie@lv的趨勢）覆蓋在平滑軌跡上。它顯示出略高于±100 ps的峰間變化。溫度變化對這個振蕩器幾乎沒有影響

Long term stability, illustrated in figure 2, involves a gradual drift in oscillator timing. Long term stability generally includes oscillator aging but excludes environmentally induced drift. Aging, in crystal oscillator is caused by a variety of electromechanical mechanisms. Long term stability is usually expressed in parts per million or ppm. A typical specification of 10 ppm means that over a 1 ms interval the clock period can change by 10 ns: △t=1ms*(10/1,000,000) =10 ns
長期穩定性，如所示 圖2涉及一個逐漸漂移振蕩器定時。長期的穩定性通常包括振蕩器老化，但不包括環境引起的漂移。老化，在晶體振蕩器中引起通過各種機電 機制。長期穩定性 通常用份/來表示 百萬或百萬分之一。10 ppm的典型規格意味著 在1毫秒的時間間隔內，時鐘 周期可以變化10 ns:△t=1ms*(10/1,000,000) =10ns

Short term stability is a function of noise signals within the oscillator and represents a phase modulation of the oscillator output. Short term stability can be specified in the time domain as jitter. The greatest drawback to this method of specifying short term stability is that it is dependent of the measurement interval. The longer the measurement observation time the greater the peak to peak jitter magnitude. Figure 3 shows a typical jitter measurement of a 400 MHz Surface Acoustic Wave (SAW) oscillator. The mean or average period is 2.4999 ns with an rms jitter (sigma) of 7 ps and a peak to peak jitter (range) of 35 ps. Note that the manufacturer of this oscillator specifies that peak to peak jitter for a measurement duration of 1000 cycles.
短期穩定性是一個函數振蕩器中的噪聲信號，代表一個貼片石英晶振相位振蕩器輸出的調制。短期穩定性可以是 在時域中指定為 抖動。最大的缺點是 這種指定short的方法術語穩定性在于它依賴于測量間隔。 測量觀察時間越長 峰峰值抖動幅度。 圖3顯示了典型的抖動 400 MHz的測量 表面聲波 振蕩器。平均值或平均數 均方根周期為2.4999 ns 7 ps的抖動(σ)和峰值 峰值抖動(范圍)為35 ps。 請注意，制造商這個振蕩器指定了那個峰值 為了測量峰值抖動 1000個周期的持續時間。

Many manufacturers minimize the observation time dependency by specifying the oscillator short term stability in terms of the Allan Variance. The Allan Variance uses the frequency difference between adjacent frequency measurements, usually made with a frequency counter, to compute the variance of oscillator output frequency.
許多制造商盡量減少 觀察時間相關性 通過指定振蕩器短路 根據Allan方差的項穩定性。艾倫方差 使用頻率差 相鄰頻率之間 測量，通常使用 一個頻率計數器，用來計算振蕩器輸出的方差 頻率。

Short term stability can also be specified in the frequency domain as phase noise. Phase noise characterizes the shape of the frequency spectrum of the oscillator. A typical phase noise specification is –100 dbC at 10 kHz offset from the carrier. Phase noise can be measured using a narrowband FFT spectrum analyzer (12-16 bit amplitude resolution) or a dedicated phase noise measurement system.
短期穩定性也可以 在頻域中指定 作為相位噪聲。相位噪聲 表征的形狀振蕩器的頻譜。典型相位噪聲 10時的規格為–100 dbC 與載波的kHz偏移。 石英晶振相位噪聲可以使用窄帶FFT頻譜來測量 分析器(12-16位振幅 分辨率)或專用階段 噪聲測量系統。

The greatest strength of the LeCroy jitter and timing analysis package is the ability to study both long term and short term variations in oscillator timing. Long memory and SmartTriggers make it easy to acquire and display this data Specialized jitter measurements combined with the capability to measure and correlate the effects of other parameters such as temperature or supply voltage are ideal for evaluating environmental stability
勒羅伊抖動和時序分析的最大優勢包是學習的能力 長期和短期振蕩器定時的變化。 長記憶和智能觸發器 使采集和顯示這種數據變得容易專門抖動 測量值與 能夠測量和關聯溫度或電源電壓等其他參數的影響是評估環境穩定性的理想選擇。

原廠編碼 品牌 系列 Description描述
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CPPC7L-A5BR-66.0TS Cardinal晶振 FIPO™ CPP OSC XO 66.000MHZ CMOS SMD
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CPPC7L-B6-40.0TS Cardinal晶振 FIPO™ CPP OSC XO 40.000MHZ CMOS SMD
CPPC7-A7BR-180.0TS Cardinal晶振 FIPO™ CPP OSC XO 180.000MHZ CMOS SMD
CPPC7L-A7BP-63.0TS Cardinal晶振 FIPO™ CPP OSC XO 63.000MHZ CMOS SMD
CPPC7L-A5BR-66.0PD Cardinal晶振 FIPO™ CPP OSC XO 66.000MHZ CMOS SMD
CPPC7L-A7BP-11.0592TS Cardinal晶振 FIPO™ CPP OSC XO 11.0592MHZ CMOS SMD
CPPC7L-A5B6-11.059TS Cardinal晶振 FIPO™ CPP OSC XO 11.0592MHZ CMOS SMD
CPPC7L-A7BR-30.0TS Cardinal晶振 FIPO™ CPP OSC XO 30.000MHZ CMOS SMD
CPPC7L-A7B6-130.0TS Cardinal晶振 FIPO™ CPP OSC XO 130.000MHZ CMOS SMD
CPPC7L-A5B6-18.432TS Cardinal晶振 FIPO™ CPP OSC XO 18.432MHZ CMOS SMD
CPPC7L-A5B6-22.1184TS Cardinal晶振 FIPO™ CPP OSC XO 22.1184MHZ CMOS SMD
CPPC7-A7BP-28.0TS Cardinal晶振 FIPO™ CPP OSC XO 28.000MHZ CMOS SMD
CPPC7L-A7B6-16.0PD Cardinal晶振 FIPO™ CPP OSC XO 16.000MHZ CMOS SMD
CPPC7L-A5BP-100.0PD Cardinal晶振 FIPO™ CPP OSC XO 100.000MHZ CMOS SMD
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CPPC7L-A5BP-2.048TS Cardinal晶振 FIPO™ CPP OSC XO 2.048MHZ CMOS SMD
CPPC7L-A5BP-25.0TS Cardinal晶振 FIPO™ CPP OSC XO 25.000MHZ CMOS SMD
CPPC7L-A7BP-12.0TS Cardinal晶振 FIPO™ CPP OSC XO 12.000MHZ CMOS SMD
CPPC7L-A5BP-25.1658TS Cardinal晶振 FIPO™ CPP OSC XO 25.1658MHZ CMOS SMD
CPPC7L-A5BP-31.25TS Cardinal晶振 FIPO™ CPP OSC XO 31.25MHZ CMOS SMD
CPPC7L-A7BR-32.768TS Cardinal晶振 FIPO™ CPP OSC XO 32.768MHZ CMOS SMD
CPPC7-A7BR-200.0TS 進口晶振 FIPO™ CPP OSC XO 200.000MHZ CMOS SMD
CPPC7L-A5BP-60.0TS Cardinal晶振 FIPO™ CPP OSC XO 60.000MHZ CMOS SMD
CPPC7L-A5BP-62.5TS Cardinal晶振 FIPO™ CPP OSC XO 62.50MHZ CMOS SMD
CPPC7L-A7BP-125.0TS Cardinal晶振 FIPO™ CPP OSC XO 125.000MHZ CMOS SMD
CPPC7L-A5BP-66.0TS Cardinal晶振 FIPO™ CPP OSC XO 66.000MHZ CMOS SMD
CPPC7L-A5BR-16.896TS Cardinal晶振 FIPO™ CPP OSC XO 16.896MHZ CMOS SMD
CPPC7L-A7BR-33.3333TS Cardinal晶振 FIPO™ CPP OSC XO 33.3333MHZ CMOS SMD
CPPC7L-A5BR-24.4196TS Cardinal晶振 FIPO™ CPP OSC XO 24.4196MHZ CMOS SMD
CPPC7-A7BR-210.0TS Cardinal晶振 FIPO™ CPP OSC XO 210.000MHZ CMOS SMD
CPPC7L-A5BR-24.6945TS Cardinal晶振 FIPO™ CPP OSC XO 24.6945MHZ CMOS SMD
CPPC7L-A5BR-25.0TS Cardinal晶振 FIPO™ CPP OSC XO 25.000MHZ CMOS SMD
CPPC7L-A7BR-40.0TS Cardinal晶振 FIPO™ CPP OSC XO 40.000MHZ CMOS SMD
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CPPC7L-A7BP-49.152TS Cardinal晶振 FIPO™ CPP OSC XO 49.152MHZ CMOS SMD
CPPC7L-A7BP-50.0TS Cardinal晶振 FIPO™ CPP OSC XO 50.000MHZ CMOS SMD
CPPC7-A7BR-30.0TS Cardinal晶振 FIPO™ CPP OSC XO 30.000MHZ CMOS SMD




 
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